RecallRadar

FDA Device recall Z-2476-2023

epoc BGEM BUN Test Card with epoc Host SW v3.37.3, epoc NXS SW v4.10.6, Sensor Configuration 41.1

On 2023-09-06 the FDA classified a Class II recall of epoc BGEM BUN Test Card with epoc Host SW v3.37.3, epoc NXS SW v4.10.6, Sensor Configuration 41.1 by Siemens Healthcare Diagnostics, citing there is potential for discrepant high glucose results in samples with glucose results on the lower end of the reportable range.

Read the official FDA Device notice

AgencyFDA Device
Recall numberZ-2476-2023
ClassificationClass II
Statusongoing
Initiated2023-06-01
Published2023-09-06
Last updated2026-09-13 11:56 UTC
CompanySiemens Healthcare Diagnostics
DistributionAL, AR, AZ, CA, CO, DC, DE, FL, IA, ID, IL, KS, KY, LA, MI, MN, MO, NC, ND, NH, NY, OH, OK, SC, SD, TX

Product

epoc BGEM BUN Test Card with epoc Host SW v3.37.3, epoc NXS SW v4.10.6, Sensor Configuration 41.1

Reason

There is potential for discrepant high glucose results in samples with glucose results on the lower end of the reportable range.

Identifiers

code_info
UDI-DI: 00809708121860 Siemens Material Number: 10736515 Lots: 04-23003-60 (expiry 20-Jun-2023), 11-22337-60 (expiry 20…UDI-DI: 00809708121860 Siemens Material Number: 10736515 Lots: 04-23003-60 (expiry 20-Jun-2023), 11-22337-60 (expiry 20-May-2023), 04-23034-40 (expiry 21-Jul-2023), 04-23059-50 (expiry 15-Aug-2023), 04-23059-60 (expiry 15-Aug-2023), and 04-23069-40 (expiry 25-Aug-2023)

Status history

No status changes recorded since RecallRadar first saw this recall on 2026-09-13 11:56 UTC. Current status: ongoing.

Source

Official record: https://api.fda.gov/device/enforcement.json?search=recall_number:%22Z-2476-2023%22

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